 課程名稱 |
【竹科管理局園慶講座】Reliability in 3D IC Technology(園慶) |
| 課程內容 |
■Mean-Time-To-Failure equations in electronic devices based on entropy production 1.Introduction: Burn-in 2.3D IC technology; New electromigration failures 3.Black’s mean-time-to-failure (MTTF) equation for electromigration 4.Modified MTTF equations for electromigration based on entropy production 5.New MTTF equations for thermomigration and stress-migration 6.Summary ■Electromigration, Thermomigration, Stress-migration and Drop Test in 3D IC Technology 1.Introduction 2.3D IC technology; New failures 3.Electromigration 4.Thermomigration 5.Stress-migration 6.Drop Test 7.Summary |
| 先修課程 |
| 上課日期 | 上課時段 | 授課老師 | 報名截止日 | 上課地點 | 報名 | 課程費用 |
|---|---|---|---|---|---|---|
| 20231116-20231116 | 週四，13:30-16:30 | 杜經寧 院士 | 20231114 | 新竹市科學園區 科技生活館 | 報名已截止 | 0 |